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AS5852B Digital X-ray Flat Panel Readout IC

256-channel low-power charge-to-digital converter


  • Line times down to 80 µs
  • Binning mode (half the number of effective channels) for faster readout speed down to 40 µs
  • Selectable parameters: input charge range, holes or electrons polarity, detector timing, low-pass filter time constant and line time
  • Up to three different internal charge pump cycles for offset adjusting, signal emulation and switch charge injection compensation
  • Sleep and full power-down modes
  • Correlated Double Sampling for offset subtraction with programmable time constant


  • Flexible programming options to optimize for application needs
  • Suitable to a wide range of detector sizes, supporting line capacitances up to 200 pF
  • Best-in-class low power consumption for static and portable applications
  • Low-noise for great image quality
  • Accurate temperature feedback
  • Chip-on-flex packaging suitable to ACF bonding on the detector side and to a low-cost standard connector on the PCB side

Product parameters

Applications Medical Imaging, Digital Radiography
Primary Function Charge-to-digital Converter
Channels 256
Resolution [bit] 16
Input Related Noise 500 electrons
Min. Power Consumption [mW per Channel] 1.1
Min. Integration Time / Line Time [µs] 80
Package Chip-on-Flex (ACF bonding + standard connector)

General description

The AS5852B is a 16-bit, 256-channel low-noise charge-to-digital converter designed for use in digital X-ray systems. The high degree of programmability enables system performance optimization in a wide range of applications. The combination of fast speed, low noise and low power consumption maximizes the image quality and minimizes patient dose, exposure whilst improving the time to market.
Each channel front-end consists of a charge sensitive amplifier (CSA) and a correlated double sampler (CDS), that removes offset and flicker noise from the signal, which is then converted to digital. A fast and reliable LVDS interface transmits the output digital data off-chip. Built-in diagnostic functionalities enable to locate the source of errors in the signal chain from the detector to the data acquisition system. Voltage references and a temperature sensor are included on the chip. An SPI interface allows easy programming of the device parameters.
A line time of 80 μs requires as little as 1.1 mW per channel. Additionally, it is possible to add together the charges in pairs of adjacent channels; with this binning, the fastest achievable line time is 40 μs.

This product suits for the following applications:

  • Static digital X-rays
  • Digital radiography
  • Portable radiography
  • Industrial Non-Destructive Testing (NDT)


Title Category Headline Buy
AS585x Eval Kit Application Board Evaluation Kit for AS585x

Technical documents

Type Description Language
Special Datasheet AS585xB Short Datasheet English

Environmental documents

Type Description Language
RoHS Certificate AS585xB RoHS Certificate English

Other information

Type Description Language
Factsheet Readout chips for X-ray flat panels English
Image AS585xB Block Diagram
Image CoF Type B Picture
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