Evaluation Kit for AS585x
General description
The AS585x Evaluation Kit is a stand-alone system, supporting all devices of the AS585x family. It allows the complete device configuration, the measurement of all the relevant parameters (like noise and input linearity) and the connection to an X-ray photodetector panel.
Two different AS585x samples are included in the Evaluation Kit in order to perform the complete evaluation:
1. AS585x Chip-on-Board (COB) sample: The AS585x die is directly bonded to the AS585x sample board, which is equipped with the signal generator circuitry. Such circuitry allows the generation of the input signals that emulate the photodetector as in the real application.
2. AS585x Chip-on-Flex (COF) sample: The default package type of the AS585x, where the die is bonded on a flex substrate. Such package allows the direct connection to an X-ray photodetector panel.
Resources
| Type | Description | Language | ||
|---|---|---|---|---|
| Evaluation Software | AS585x_EvalSW_v2-0-0.exe GUI for the ams AS585x Eval Kit | EN | ||
| Evaluation Software | AS585x_EvalSW_UserGuide-UG000439_v3-0-0.pdf AS585x EvalKit User Guide | EN |
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Four different power modes allow the user to minimize the current consumption for the chosen speed. Line times of 20, 28.5, 40 and 80 μs require as little as 3.1, 2.6, 1.6 and 1.1 mW per channel respectively. A special ADC operation mode is also available, that decreases the minimum line time to 15 μs without increasing the power consumption. Additionally, it is possible to add together the charges in pairs of adjacent channels; with this binning, the fastest achievable line time is 10 μs.
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Each channel front-end consists of a charge sensitive amplifier (CSA) and a correlated double sampler (CDS), that removes offset and flicker noise from the signal, which is then converted to digital. A fast and reliable LVDS interface transmits the output digital data off-chip. Built-in diagnostic functionalities enable to locate the source of errors in the signal chain from the detector to the data acquisition system. Voltage references and a temperature sensor are included on the chip. An SPI interface allows easy programming of the device parameters.
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